As technology shrinks, Yield and Reliability (YAR) are major challenges of SoC (System on Chip) production. There are many techniques available for increasing YAR. YAR of devices depend on testing ...
Peter Maxwell, Research and Development Specialist, Semiconductor Products Group, Agilent Technologies Inc., Santa Clara, Calif., Pete O'Neil, Senior Technology ...
San Jose, Calif., April 22, 2002 - LogicVision, Inc., (NASDAQ:LGVN), a leading provider of embedded test IP for integrated circuits and systems, today announced that Q-Star Test nv, the premier ...
DFT's main target is to achieve maximum controllability and observability which helps to improve the yield and reliability of design. IDT helps improve the CVY and also the reliability of the design.
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