Modern technology builds on abstractions. Most application programmers today don’t know what a non-maskable interrupt is, nor should they have to. Even fewer understand register coloring or ...
A convergence of DFT techniques and the proliferation of in-silicon monitors can flag potential failures before they occur.
The number and variety of test interfaces, coupled with increased packaging complexity, are adding a slew of new challenges.
We concluded part 2 of this series by starting to write node and loop equations for a five-resistor Wheatstone bridge circuit ...
Abstract: This paper presents a characterization approach to study Local Layout Effects (LLEs) in FinFET devices. Since mechanical stress is commonly used as a mobility booster in modern transistors, ...
Abstract: In this paper, an enhanced equivalent circuit model for the short structure is proposed to improve the open-short de-embedding method. The model incorporates a frequency-dependent inductor ...
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